Design for Manufacturability and Yield for Nano- Scale CMOS
by Chiang (Charles C); Kawa (Jamil)
Published by : Springer (India) P. Ltd., ISBN:8184892444.
Subject(s):
VLSI Design
Year: 27
Item type | Current location | Call number | Status | Notes | Date due | Barcode |
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Kumaraguru College of Technology | 621.38.06VLSI CHI (Browse shelf) | Available | MCE | 52817 |
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621.38.06VLSI BUS "Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits" | 621.38.06VLSI CAM VLSI Design of Non-volatile Memories | 621.38.06VLSI CHI Design for Manufacturability and Yield for Nano- Scale CMOS | 621.38.06VLSI CHI Design for Manufacturability and Yield for Nano- Scale CMOS | 621.38.06VLSI CHI Design for Manufacturability and Yield for Nano- Scale CMOS | 621.38.06VLSI CHI Design for Manufacturability and Yield for Nano- Scale CMOS | 621.38.06VLSI CHI Design for Manufacturability and Yield for Nano- Scale CMOS |
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