Design-for- Test for Digital Ics and Embedded Core Systems
by Crouch (Alfred L)
Published by : Dorling Kindersley Ltd. ISBN:8131717895.
Subject(s):
Digital Integrated Circuits
Year: 28
Item type | Current location | Call number | Status | Notes | Date due | Barcode |
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Kumaraguru College of Technology | 621.3.049.77:681.32 (Browse shelf) | Available | EIE | 51903 |
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621.3.049.77:681.32 CMOS Digital Integrated Circuits: Analysis and Design | 621.3.049.77:681.32 Digital Integrated Circuits: a Design Perspective | 621.3.049.77:681.32 Analysis and Design of Digital Integrated Circuits: In Deep Submicron Technology | 621.3.049.77:681.32 Design-for- Test for Digital Ics and Embedded Core Systems | 621.3.049.77:681.32 CMOS Digital Integrated Circuits: Analysis and Design | 621.3.049.77:681.32 Digital Integrated Electronics | 621.3.049.77:681.32 Digital Integrated Electronics |
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