Essentials of Electronic Testing for Digital, Memory and Mixed - Signal VLSI Circuits
by Bushnell (Michael L); Agrawal (Vishwani D)
Published by : Springer Science + Business Media, Inc., ISBN:792379918.
Subject(s):
VLSI Design
Year: 18
Item type | Current location | Call number | Status | Notes | Date due | Barcode |
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Kumaraguru College of Technology | 621.38.06VLSI BUS (Browse shelf) | Available | EIE | 51865 |
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